Littelfuse PGB20402 Series Bedienungsanleitung PDF herunterladen (Seite 5)

www.littelfuse.com

PGB2 Series

Speciﬁcations are subject to change without notice.

Revised: March 8, 2011

PulseGuard

Suppressors

Surface Mount Polymeric ESD Suppressors

Two of the most common methods used in industry for

characterizing the performance of ESD suppressors are

ESD transient testing, per IEC 61000-4-2 ESD waveform,

BOE5-14JODFOPTUBOEBSETFYJTUGPSNFBTVSFNFOUBOE

qualiﬁcation of ESD suppressor performance, these

two methods have become the de-facto standard for

determining device trigger and clamp speciﬁcations. It

is common to see trigger values to be based on the TLP

method and clamping values based on the ESD transient

method. Low voltage TLP obtained trigger values most

closely resemble device DC turn-on .Since the two test

NFUIPETBSFEJGGFSFOUBOEOPNFUIPEFYJTUTUPBDDVSBUFMZ

correlate suppressor response between the two test

methods, trigger and clamp values should be speciﬁed for

each method.

ESD transient testing, which is based on the IEC 61000-4-2

standard waveform, consists of subjecting a ESD

suppressor to an subnanosecond risetime 8Kv transient

generated by a commercial ESD simulator and recording

trigger and clamp voltage levels. Clamp voltage level is

obtained at 25ns. The basic ESD simulator circuit consists

PGB3$EJTDIBSHFOFUXPSLXJUI3BOE$WBMVFTPG

PINTBOEQJDPGBSBET8BWFGPSNTBSFDBQUVSFEVTJOHB

4 GHz oscilloscope(50 ohm input) with 20X resistive divider

probes and a 30dB attenuator. Figures 1 and 2 show IEC

current waveform and test setup.

5SBOTNJTTJPOMJOF1VMTFUFTUJOHDPNNPOMZLOPXBT

TLP testing consists of subjecting a ESD suppressor

to a 50 ohm transmission line discharge pulse with a

subnanosecond risetime and a pulse width of 65ns. Trigger

values are obtained by varying the TLP voltage until a

EFWJDFUSJHHFSWPMUBHFJTEFUFSNJOFE0ODFUIFEFWJDFJT

USJHHFSFEBDMBNQWBMVFJTEFUFSNJOFEBUOT8BWFGPSNT

are captured using a 4 GHz oscilloscope(50 ohm input)

with 20X resistive divider probes and a 30dB attenuator.

Figures 3 and 4 show a typical TLP voltage waveform and

test setup.

*UTIPVMECFOPUFEUIBUOPNFBTVSFNFOUTUBOEBSEFYJUT

for obtaining trigger and clamp voltage levels. Trigger and

clamp values will vary from one test setup to another.

Due to the subnanosecond risetime of ESD and TLP

waveforms, any parasitic inductance and capacitance in

UIFUFTUTZTUFNXJMMBGGFDUNFBTVSFNFOUT"OZFGGFDUT

due to inductance and capacitance need to be subtracted

from the ﬁnal measurement. It is important to remember

that the test system will introduce a load across the

ESD suppressor under test and this will also affect

NFBTVSFNFOUT"IJHICBOEXJEUI0INPTDJMMPTDPQF

and probes(>1Ghz) need to be used for obtaining best

SFTVMUT"UUFOVBUJPOWBMVFTGPSUIFQSPCFUJQTIPVMECF

at least 20X in order to obtain high input impedance for

measurements.

Characterization Methods for ESD Suppressors

Time in nanoseconds

020406080

Volts

100

200

300

400

500

600

100%

90%

10%

30n

60n

tr = 0.7 to 1.0ns

Current (I) %

503.165150pf8000 DUT

330 950 46.93 46.93

ESD Simulator Scope Probe 30db Attenuator 50 Ohm

Scope Input

50 Ohm

Scope Input

503.165500 DUT

950 46.93 46.93

TLP Scope Probe 30db Attenuator

Figure 3

Figure 4

Figure 1

Figure 2

1 2 3 4 5

Kommentare zu diesen Handbüchern

Keine Kommentare

Littelfuse PGB20402 Series Bedienungsanleitung Seite 5

Kommentare zu diesen Handbüchern

Verwandte Produkte und Handbücher für Hardware Littelfuse PGB20402 Series